Author(s): Eric Lifshin,Patrick Echlin,David C. Joy,Charles E. Lyman,Dale E. Newbury,J.R. Michael,Joseph Goldstein,Linda C. Sawyer
Format: Paperback
No. of Pages: 689
Publisher: Springer-Verlag New York Inc.
Language: English
Date Published: 2013-05-31
Dimensions: 178 x 252 x 40mm
Publication City/Country: New York, NY, United States
Edition: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Illustrations: XIX, 689 p.
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Format: Paperback
No. of Pages: 689
Publisher: Springer-Verlag New York Inc.
Language: English
Date Published: 2013-05-31
Dimensions: 178 x 252 x 40mm
Publication City/Country: New York, NY, United States
Edition: 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003
Illustrations: XIX, 689 p.
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
| Book Info | |
| Author | Eric Lifshin, Patrick Echlin, David C. Joy, Charles E. Lyman, Dale E. Newbury, J.R. Michael, Joseph Goldstein, Linda C. Sawyer |
| Date Published | 2013-05-31 |
| Dimensions | 178 x 252 x 40mm |
| Edition | 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003 |
| First Author | Eric Lifshin |
| Format | Paperback |
| Illustrations | XIX, 689 p. |
| ISBN | 9781461349693 |
| Language | English |
| No. of Pages | 689 |
| Publication City/Country | New York, NY, United States |
| Publisher | Springer-Verlag New York Inc. |
Scanning Electron Microscopy and X-Ray Microanalysis
- Eric Lifshin
- Paperback
- Publisher: Springer-Verlag New York Inc.
- ISBN: 9781461349693
- Availability:In Stock
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$3,276